SPM-9700HT — Scanning Probe Microscope
Making the Unknown Visible Scanning probe microscope (SPM) is a generic term for microscopes that scan sample surfaces with an extremely sharp probe to...
SPM-8100FM — High Resolution Scanning Probe Microscope
See the Nano World Come to Life
The new HR-SPM scanning probe microscope uses frequency detection.his instrument is not only capable of ultra-high resolution observations...
PDA-8000 — Optical Emission Spectrometer
This instrument is capable of high sensitivity quantitative analysis of iron and steel, copper, aluminum alloys and other solid metals, as well as impurities...
AXIS Supra+ — XPS Surface Analysis Instrument
Our next generation XPS, the AXIS Supra+, with enhanced performance over its predecessor, combines market leading spectroscopic and imaging capabilities with unrivalled automation to ensure high...
EDX-7200 — Energy Dispersive X-ray Fluorescence Spectrometer
The EDX-7200 is a flagship model of the EDX series in pursuit of high sensitivity, high speed and high precision. This model supports...
EPMA-8050G — Electron Probe Microanalyzer
Debut of the Grand EPMA With a Cutting-Edge FE Electron Optical System, the Ultimate in Advanced Shimadzu EPMA Analysis Performance
This instrument is equipped with...
AXIS Nova — Surface Analysis Spectrometer
X-ray photoelectron spectroscopy (XPS), also known as electron spectroscopy for chemical analysis (ESCA), is a mature and widely used surface analysis technique for materials...
ALTRACE — Energy Dispersive X-ray Fluorescence Spectrometer
Detect trace elements with ease.A combination of optical system design and Shimadzu's proprietary high-speed signal processingtechnology allows ALTRACE to reach new heights in terms...
MXF-2400 — Multi-Channel X-Ray Fluorescence Spectrometer
Wavelength Dispersive X-Ray Fluorescence Spectrometer The Shimadzu MXF-2400 is an improved version of the Shimadzu Multi-Channel X-ray fluorescence spectrometer, which has been rated...
EDX-LE — Energy Dispersive X-Ray Fluorescence Spectrometer
EDX-LE is an X-ray fluorescence spectrometer designed specifically for screening elements regulated by RoHS/ELV directives. The model uses a detector (Si-PIN semiconductor detector) that...