SPM-8100FM — High Resolution Scanning Probe Microscope
See the Nano World Come to Life
The new HR-SPM scanning probe microscope uses frequency detection.his instrument is not only capable of ultra-high resolution observations...
EDX-LE — Energy Dispersive X-Ray Fluorescence Spectrometer
EDX-LE is an X-ray fluorescence spectrometer designed specifically for screening elements regulated by RoHS/ELV directives. The model uses a detector (Si-PIN semiconductor detector) that...
MXF-2400 — Multi-Channel X-Ray Fluorescence Spectrometer
Wavelength Dispersive X-Ray Fluorescence Spectrometer The Shimadzu MXF-2400 is an improved version of the Shimadzu Multi-Channel X-ray fluorescence spectrometer, which has been rated...
EDX-7200 — Energy Dispersive X-ray Fluorescence Spectrometer
The EDX-7200 is a flagship model of the EDX series in pursuit of high sensitivity, high speed and high precision. This model supports...
SPM-9700HT — Scanning Probe Microscope
Making the Unknown Visible Scanning probe microscope (SPM) is a generic term for microscopes that scan sample surfaces with an extremely sharp probe to...
EPMA-8050G — Electron Probe Microanalyzer
Debut of the Grand EPMA With a Cutting-Edge FE Electron Optical System, the Ultimate in Advanced Shimadzu EPMA Analysis Performance
This instrument is equipped with...
AXIS Supra — XPS Surface Analysis Instrument
The spectroscopic and imaging performance of an X-ray photoelectron spectrometer define its ability to perform in the most demanding research and development laboratories. The...
PDA-5000 — Optical Emission Spectrometer
Top Perfor mance of Analysis
PDA-5000 integrates the essence and the latest analysis technology of Shimadzu spectrometer. It is a ground direct-reading spectrometer customized for...
PDA-7000 — Optical Emission Spectrometer
Emission spectrometry provides rapid and accurate simultaneous determination of many elements in metals. This technique has been adopted as standard method for metal analysis....
SPM-Nanoa — Scanning Probe Microscope/ Atomic Force Microscope
Automatic Observation
Adjusts Laser Beam, Adjusts Parameter Settings During Observation, and Performs Image Processing Automatically
Operating time when using standard samples and standard cantilever: about 5...