Thursday, April 25, 2024

AXIS Supra+ — XPS Surface Analysis Instrument

Our next generation XPS, the AXIS Supra+, with enhanced performance over its predecessor, combines market leading spectroscopic and imaging capabilities with unrivalled automation to...
Shimadzu SPM-Nanoa

SPM-Nanoa — Scanning Probe Microscope/ Atomic Force Microscope

Automatic Observation Adjusts Laser Beam, Adjusts Parameter Settings During Observation, and Performs Image Processing Automatically Operating...

SPM-8100FM — High Resolution Scanning Probe Microscope

See the Nano World Come to Life The new HR-SPM scanning probe microscope uses frequency detection.his instrument is not...

AXIS Supra — XPS Surface Analysis Instrument

The spectroscopic and imaging performance of an X-ray photoelectron spectrometer define its ability to perform in the most demanding research and development laboratories. The...

AXIS Nova — Surface Analysis Spectrometer

X-ray photoelectron spectroscopy (XPS), also known as electron spectroscopy for chemical analysis (ESCA), is a mature and widely used surface analysis technique...

EPMA-8050G — Electron Probe Microanalyzer

Debut of the Grand EPMA With a Cutting-Edge FE Electron Optical System, the Ultimate in Advanced Shimadzu EPMA Analysis Performance

EPMA-1720 HT — Electron Probe Microanalyzer

Revolutionary Fusion of Advanced Analytical Capabilities and Superb Operability Technology at the Pinnacle of Evolution Finally Arrives High Sensitivity, High Accuracy,...

SPM-9700HT — Scanning Probe Microscope

Making the Unknown Visible Scanning probe microscope (SPM) is a generic term for microscopes that scan sample surfaces with an extremely sharp...