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Unparalleled Sensitivity

With Shimadzu’s combination of optical system design and proprietary high-speed signal processing, ALTRACE reaches the highest detection sensitivity compared to Shimadzu’s general-purpose systems (EDX-7200).

Unparalleled Sensitivity that Goes Beyond Typical Measurement Needs

• The combination of optical system that optimally arranges high-power X-ray tube and high-sensitivity detector, and high-speed signal processing has achieved high detection efficiency.
  In the analysis of aqueous solution samples, the detection limit for all elements have been improved compared to the conventional equipment (EDX-7200).
  It can be used effectively for the analysis of low-concentration samples and the automatic analysis of multiple samples requiring shorter measurement time.
• Comparison of detection limit between conventional
  equipment (EDX-7200) and ALTRACE

Implements batch element analysis across a wide range from the sub ppm level to the % level

Automatic Filter Exchange Improves Sensitivity

• 
  
  Background removal is facilitated by a primary X-ray filter, thereby improving S/N ratio. For trace-level analysis, where background is not negligible, filters are particularly advantageous.
  ALTRACE is equipped with 6 primary filters (8 types, including open and attenuator), which can be exchanged autonomously by the software.
•  Effective Energy (keV)Example of Applicable ElementsFilter #114 to 38Mo,Rh,Pd,Ag,Cd,Sn,SbFilter #22 to 4S,ClFilter #35 to 10r,Mn,Fe,Co,NiFilter #49 to 10HgFilter #59 to 14As,Br,Zr,Hg,Pb,BiFilter #64 to 5Ti,V

Escape from Complicated Pretreatment

Liquids and powders can be directly measured by simply placing them as is in the sample cell. EDX is a non-destructive technique; therefore, the same sample can be measured for both simple screening and precision analysis. To date, previous EDX systems could not measure concentrations on the order of 0.1 ppm. With ALTRACE, this level is now detectable. It is now possible to obtain sub-ppm level detection, without the need for chemical pretreatment.

Simple Screening in Combination with Precision Analysis

When performing quantitative analysis by specifying elements, once a calibration curve is created, there is no need to recreate the calibration curve for each measurement.
In addition, ALTRACE is suitable for simple screening analysis, since qualitative and quantitative analysis using the fundamental-parameter (FP) method can be performed without specifying elements

Solids, Powders and Liquids Can Be Measured As Is

With ALTRACE, samples are placed into a dedicated sample cell. The sample is supported by a transparent X-ray film that is suitable for the sample.

• Powdered Samples and Pellet SamplesPowder and pellet samples are placed in the sample cell and supported with polypropylene film.
• Liquid Samples (Water Soluble and Oleaginous)Aqueous solutions are poured into the sample cell and supported on a polypropylene film. Other liquids, such as organic solvents, can be measured by using an appropriate film.

High Throughput and Efficiency

Automatic Consecutive Analyses of Up to 48 Samples

710mm wide main body is equipped with a multi-sample changer. The tray drawer system allows for safe sample replacement without having to access the inside of the instrument.

Analysis can be Paused and Reassigned, Increasing Flexibility

“This is the First time I’ve used a spectrometer. Will it be easy for me to use without any specialist knowledge?”

“Can it make correct judgments even with very strict threshold values?”
When it comes to the requirements on X-ray Fluorescence spectrometers for RoHS/ELV hazardous element screening, Shimadzu provides:

Security—provided by user-friendly features that allow judgments to be made automatically by the device
Reliability—provided by performance that allows precise analysis of a wide range of elements

The EDX-LE Plus is highly-optimized to meet these user needs.

Making the Diffcult Simple

• The “Screening Analysis” window makes operation easy
• Fully automatic, from selecting conditions to determining main components
• Simple screening setting functions can be changed easily with the control system on the user side

Fully Equipped with Essential Functions

• RoHS/ELV analysis functions are included as standard
• Large sample chamber enables as-is measurement of large samples
• Protection functions restrict changing conditions or data

Analysis Conditions for RoHS/ELV Elements Included As Standard

• Includes analytical conditions for measuring cadmium, lead, mercury, chromium, and bromine (with built-in calibration curves).
• The included polyethylene check sample eliminates any concern over instrument management.
• Screening options are available for chlorine and even antimony in plastics.

EDX-7200 for High Speed, High Sensitivity and High Accuracy

High Speed - Throughput Increased by Up to a Factor of 30 –

Equipped with a high-speed circuit that increase the count rate by up to 30 times compared to the former model (EDX-720).
Improved algorithms and improved performance also help to reduce measurement times.

• Comparison of Lead Profiles in Copper Alloys
• Comparison of Chromium Profiles in Copper Alloys

Comparison Using Actual Samples

Sample External Appearance

Repeatability using the EDX-7200 and the previous model (EDX-720) was compared for lead (Pb) in lead-free solder.

• Relationship Between Measurement Time and
  Standard Deviation (Variance in Quantitation Values)
• Measurement Time Required to Reach the Target Analysis Precision

Extending the measurement time to increase the fluorescent X-ray count can improve the precision (repeatability) of X-ray fluorescence spectrometry.
The EDX-7200 incorporates a high-count-rate SDD detector and a high-speed circuit that achieves highly precise analysis of the target in a shorter measurement time.

High Sensitivity　- Improves Lower Detection Limit by Up to 6 Times –

In metals analysis, the lower detection limit of trace elements in main components has been improved.

Guide of the Lower Detection Limit (300 sec) for Lead in Metals

Note: The detection limit is an example and not a guaranteed value.

High Resolution

High Resolution

• EDX-7200 offers superior energy resolution compared to previous models by incorporating a state-of-the-art SDD detector.
  This reduces the effects of overlapping peaks of different elements, enhancing the reliability of the analysis results.
• Comparison of Energy Resolutions (sample: PPS resin)

No Liquid Nitrogen Required

The SDD detector is capable of electronic cooling. Since there is no need to use liquid nitrogen, it reduces running costs.

Range of Detected Elements

• An optional vacuum measurement unit or helium purge unit is required to measure light elements (15P and below) with the EDX-7200.
• Lower detection limit varies depending on the sample matrix or coexisting elements.
• Lower detection limit of light elements (20Ca and below) gets worse when the sample cell film is used.

Sample Observation Camera and Collimators

• Automatic collimator switching in four stages: 1, 3, 5, and 10 mm diameter
  Select the irradiation chamber from four values to suit the sample size.
  Select the most appropriate irradiation diameter for the sample shape: 1 mm diameter for trace foreign matter analysis or defect analysis; 3 mm or 5 mm diameter for small sample volumes.
  
  Sample observation camera included as standard
  Use the sample observation camera to confirm the X-ray irradiation area on a specific position.
  This is useful for measuring small samples, samples comprising multiple areas, or when using with a Micro X-Cell^®.

Automatic Replacement of Five Primary Filters

• Primary filters enhance detection sensitivity by reducing the continuous X-rays and the characteristic X-rays from the X-ray tube.
  They are useful for the analysis of trace elements.
  The EDX-7200 incorporates five primary filters (six, including the open position), which can be automatically changed using the software.

Effect of the Primary Filters

Freely Combine Collimators and Primary Filters

The collimators and primary filters are driven independently and can be combined to address specific requirements. Select the optimal combination from 24 (6 filters x 4 collimators) available options.
Quantitative analysis using the FP method is possible with all combinations.

Vacuum Measurement Unit and Helium Purge Unit (Option)

Sensitivity for light elements can be increased by removing atmosphere. Two options are available: a vacuum measurement unit and a helium purge unit.
The helium purge unit is effective when measuring liquid samples and samples that generate a gas and cannot be measured in a vacuum.

• Relative Sensitivity of Measurements with Helium Purging and in Air
  (sensitivity in vacuum = 100)
• Profile Comparison in Vacuum and Air
  (sample: soda-lime glass)

Helium Replacement Measurement Unit (Option)

• Helium replacement is effective for the analysis of the elements contained in a sample that cannot be placed in a vacuum atmosphere, such as generating liquid or gas. Equipped with a highly efficient helium gas replacement system (Japanese patent No. 5962855), it reduces measurement time and helium gas consumption.
• Profile Comparison in Air and Helium After Purging
  (EDX-7200 / sample: sulfur in oil)

• 12-Sample Turret (Option)The addition of the turret allows automated continuous measurements. It improves throughput, especially for measurements in a vacuum or helium atmosphere.

• Calibration Curve MethodA standard sample is measured and the relationship with the fluorescent X-ray intensity plotted as a calibration curve, which is used for the quantitation of unknown samples.
  Although this method requires selection of a standard sample close to the unknown sample and creation of a calibration curve for each element, it achieves a high level of analysis accuracy.
  This method supports all types of corrections for coexistent elements, including absorption/excitation correction and correction for overlapping elements.

Fundamental Parameter (FP) Method

• This method uses theoretical intensity calculations to determine the composition from the measured intensities. It’s a powerful tool for the quantitative analysis of unknown samples in cases where preparation of a standard sample is difficult. (JP No. 03921872, DE No. 60042990. 3-08, GB No. 1054254, US No. 6314158)
• Automatic Balance Setting Function (Patent pending)
  A balance setting is required to use the FP method on principal components such as C, H, and O. The software automatically sets the balance if it determines from the profile shape that a balance setting is required.

Film FP Method

The instrument also offers the thin-film FP method function. The film FP method permits the film thickness measurement of multilayer films, simultaneous film thickness measurements, and quantitative film composition.
When using the film FP method, the substrate material, deposition sequence, and element information can be set.

• Background FP MethodThe background FP method adds scattered X-ray (background) calculations to the conventional FP method, which only calculates the fluorescent X-ray peak intensity (net peak intensity).
  (Patent pending : Japanese Patent No. 5975181)
  This method is effective at improving quantitation accuracy for small quantities of organic samples, film thickness measurements of irregular-shaped plated samples, and film thickness measurements of organic films.

• Matching FunctionThe matching function compares analysis data for a sample with an existing data library and displays the results in descending degree of confidence.
  The library contains content data and intensity data and the user can register each type. The content data values can be entered manually.

Functional Design

Large Sample Chamber with Small Footprint

Installed width is 20% smaller than the previous instrument (EDX-720) due to its compact body size.
The EDX-7200 can accommodate samples up to a maximum size of W300 x D275 x approx. H100 mm.

High-Visibility LED Lamp

When X-rays are generated, an X-ray indicator at the rear of the instrument and an X-RAYS ON lamp at the front turn on, so that the instrument status can be monitored even from a distance.

PCEDX Navi Software Allows Easy Operation from the Start

PCEDX Navi software is designed to simplify X-ray fluorescence spectrometry for beginners, while providing the feature set and capabilities demanded by more experienced users.
The straightforward user interface offers intuitive operation and provides a convenient operating environment for beginners and experts alike.

Simple Screen Layout

Sample image display, analysis conditions selection, and sample name input on the same screen.

Collimator Switching from the Measurement Screen

Change the collimator diameter while observing the sample image.
The selected diameter is indicated by a yellow circle.

Automatic Storage of Sample Images

The sample image is loaded automatically when the measurement starts. Sample images are saved with a link to the data file.

Functional Design

Large Sample Chamber with Small Footprint

Installed width is 20% smaller than the previous instrument (EDX-720) due to its compact body size.
The EDX-8100 can accommodate samples up to a maximum size of W300 x D275 x approx. H100 mm.

High-Visibility LED Lamp

When X-rays are generated, an X-ray indicator at the rear of the instrument and an X-RAYS ON lamp at the front turn on, so that the instrument status can be monitored even from a distance.

PCEDX Navi Software Allows Easy Operation from the Start

PCEDX Navi software is designed to simplify X-ray fluorescence spectrometry for beginners, while providing the feature set and capabilities demanded by more experienced users.
The straightforward user interface offers intuitive operation and provides a convenient operating environment for beginners and experts alike.

Simple Screen Layout
Sample image display, analysis conditions selection, and sample name input on the same screen.

Collimator Switching from the Measurement Screen
Change the collimator diameter while observing the sample image.
The selected diameter is indicated by a yellow circle.

Automatic Storage of Sample Images
The sample image is loaded automatically when the measurement starts.
Sample images are saved with a link to the data file.

Once the measurement is complete, the element names, concentrations, 3σ (measurement variance) are displayed, together with the sample image, in an easy-to-understand layout.
Display the result list and individual report with a single mouse click.

Support for Continuous Measurements

PCEDX Navi supports measurements using the optional turret.
Switch between the sample image screen and sample positioning screen.

Unrivaled Analytical Performance

The high-performance SDD detector and optimized hardware achieve a high level of sensitivity, analysis speed, and energy resolution that were previously unattainable. It supports light element analysis of ₆C to, and can be used in conjunction with the helium substitution option to analyze liquid samples containing light elements (F to Al) as is.

High Sensitivity　− Lower Limit of Detection Improved 1.5 to 5 Times! −

The high-performance SDD detector and combination of optimized optics and primary filters achieve previously unheard-of high levels of sensitivity. The sensitivity is higher than the previous Si (Li) semiconductor detector across the entire range from light to heavy elements.

High Speed　− Throughput Increased by up to a Factor of 10 −

The high fluorescent X-ray count per unit time (high count rate) of the SDD detector permits highly precise analysis in a shorter measurement time. This feature is achieved to the maximum when analyzing samples that generate a lot of fluorescent X-rays, such as samples with a metal as the Main component element.

Comparison Using Actual Samples

Repeatability using the EDX-8100 and the previous model were compared for lead (Pb) in lead-free solder.

Extending the Measurement time to increase the fluorescent X-ray count can improve the precision (repeatability) of X-ray fluorescence spectrometry.
The EDX-8100 incorporates a high-count-rate SDD detector that achieves highly precise analysis of the target in a shorter Measurement time than the previous model.

Measurement time Required to Reach the Target Analysis Precision

High Resolution

The EDX-8100 instruments achieve superior energy resolution compared to previous models by incorporating a state-of-the-art SDD detector.
This reduces the effects of overlapping peaks of different elements, enhancing the reliability of the analysis results.

No Liquid Nitrogen Required

The high fluorescent X-ray count per unit time (high count rate) of the SDD detector permits highly precise analysis in a shorter measurement time. This feature is achieved to the maximum when analyzing samples that generate a lot of fluorescent X-rays, such as samples with a metal as the Main component element.

Range of Detected Elements

• An optional vacuum measurement unit or helium purge unit is required to measure light elements (₁₅P and below) with the EDX-8100.
• Lower detection limit vary depending on the sample matrix or coexisting elements.
• Lower detection limit of light element (₂₀Ca and below) get worse when the sample cell film is used.
• It is impossible to measure ₈O and below with sample cell film.

Ultra-Light Element Analysis by EDX-8100

The EDX-8100 features an SDD detector with a special ultra-thin-film window material that is able to detect ultra-light elements such as carbon (C), oxygen (O), and fluorine (F)

Extremely Flexible

Accommodates all types of samples from small to large, from powders to liquids. Options include a vacuum measurement unit and helium purge unit for highly sensitive measurement of light elements and a 12-sample turret for automated continuous measurements.

Sample Observation Camera and Collimators

Automatic collimator switching in four stages: 1, 3, 5, and 10 mm diameter

Select the irradiation chamber from four values to suit the sample size.
Select the most appropriate irradiation diameter for the sample shape: 1 mm diameter for trace foreign matter analysis or defect analysis; 3 mm or 5 mm diameter for small sample volumes.

Sample observation camera included standard

Use the sample observation camera to confirm the X-ray irradiation position on a specific position to measure small samples, samples comprising multiple areas, or when using a Micro X-Cell.

Automatic Replacement of Five Primary Filters

Primary filters enhance detection sensitivity by reducing the continuous X-rays and the characteristic X-rays from the X-ray tube. They are useful for the analysis of trace elements.
The EDX-8100 incorporates five primary filters as standard (six, including the open position), which can be automatically changed using the software.

* This filter also cuts the background in the energy range shown in parentheses ( ).

Effect of the Primary Filters

Freely Combine Collimators and Primary Filters

The collimators and primary filters are driven independently and can be combined to address specific requirements. Select the optimal combination from 24 (6 filters x 4 collimators) available options.
Quantitative analysis using the FP method is possible with all combinations.

Optional Vacuum Measurement Unit and Helium Purge Unit

Sensitivity for light elements can be increased by removing atmosphere. Two options are available: a vacuum measurement unit and a helium purge unit.
The helium purge unit is effective when measuring liquid samples and samples that generate a gas and cannot be measured in a vacuum.

Relative Sensitivity of Measurements with Helium Purging and in Air
(sensitivity in vacuum = 100)

Profile Comparison in Vacuum and Air
(sample: soda-lime glass)

Advanced Helium Purge Unit (Option)

This proprietary system (Japanese Patent No. 5962855) efficiently purges the instrument with helium gas to achieve an approximately 40 % reduction in purge time and helium gas consumption compared to previous units.
(Option for EDX-8100)

Profile Comparison in Air and Helium After Purging
(EDX-8100 / sample: fluorine in fluorine coating agent)

12-Sample Turret (Option)

The addition of the turret allows automated continuous measurements. It improves throughput, especially for measurements in a vacuum or helium atmosphere.

Comprehensive Quantitation Functions

Calibration Curve Method

A standard sample is measured and the relationship with the fluorescent X-ray intensity plotted as a calibration curve, which is used for the quantitation of unknown samples.
Although this method requires selection of a standard sample close to the unknown sample and creation of a calibration curve for each element, it achieves a high level of analysis accuracy.
This method supports all types of corrections for coexistent elements, including absorption/excitation correction and correction for overlapping elements.

Fundamental Parameter (FP) Method

This method uses theoretical intensity calculations to determine the composition from the measured intensities. It’s a powerful tool for the quantitative analysis of unknown samples in cases where preparation of a standard sample is difficult. (JP No. 03921872, DE No. 60042990. 3-08, GB No. 1054254, US No. 6314158)

Automatic Balance Setting Function (Patent pending)
A balance setting is required to use the FP method on principal components such as C, H, and O. The software automatically sets the balance if it determines from the profile shape that a balance setting is required.

Film FP Method

The instrument also offers the thin-film FP method function. The film FP method permits the film thickness measurement of multilayer films, and simultaneous film thickness measurements and quantitative film composition.
When using the film FP method, the substrate material, deposition sequence, and element information can be set.

Background FP Method

The background FP method adds scattered X-ray (background) calculations to the conventional FP method, which only calculates the fluorescent X-ray peak intensity (net peak intensity).
(Patent pending: Japanese Patent No. 5975181)
This method is effective at improving quantitation accuracy for small quantities of organic samples, film thickness measurements of irregular-shaped plated samples, and film thickness measurements of organic films.

Matching Function

The matching function compares analysis data for a sample with an existing data library and displays the results in descending degree of confidence.
The library contains content data and intensity data and the user can register each type. The content data values can be entered manually.

Functions to Enhance Usability

Easy Instrument Startup

PCEDX Navi offers instrument initialization and startup (X-ray startup) with simple mouse-click operations.
After instrument startup, the stabilization function operates for 15 minutes. Analysis and instrument checks are disabled during this period, ensuring that all users collect data in a stable instrument environment.

Automatic X-ray Tube Aging

When an X-ray tube has not been used for a long period, it requires aging before it can be used again. The software automatically performs the appropriate aging according to the period of non-use.

Condition Password Protection

The software offers password protection. Condition settings and changes can only be made by a person who enters the password.

Incorporates General Analysis Software

EDX-8100 incorporates PCEDX Pro software that has more flexibility functions. This software offers analysis, conditions settings, and data processing using familiar operations. It also allows loading of data profiles and quantitation values acquired with a previous Shimadzu EDX series instrument.

Various Data Output Formats

Report Creation Functions

Analysis data reports can be created in HTML or Excel format. A variety of templates is available.
The sample image automatically saved when measurement started is pasted in the report for confirmation of the measurement position.

RoHS Screening Report in Excel Format

* Microsoft Office Excel must be purchased separately.

General Analysis Report in HTML Format

List Creation Functions

Lists of the analysis results for multiple samples can be created in Excel format. Data can be selected in the list for detailed display or editing. A variety of list generation templates is available, including a list of RoHS specific hazardous elements and user-defined lists of elements.

User-Definable List of Elements

Exceptional labor-saving, high-speed screening

• Offers functions dedicated to screening five RoHS-controlled elements plus chlorine
• Reduced running costs, easier maintenance
• Easily customize screening to suit your control system

Offers functions dedicated to screening five RoHS-controlled elements plus chlorine

Typical functions requiring an EDX specialist are automated and therefore samples can be analyzed by a novice. The EDX-LE permits high-speed screening of five RoHS-controlled elements plus chlorine (as an option). EDX-LE takes just 1 minute from the start of measurement to results evaluation (depending on the sample).
In addition to the high-speed screening, it maintains a high level of analysis reliability.

Easy, highly accurate screening

Start measurements just 15 minutes after turning on the power.
Measurement stops immediately after the target elements have been evaluated to save time, while ensuring highly sensitive and reliable analysis. Simple single-point calibration curves are registered in the instrument to allow quantification without the need for standard samples.

The analysis of a plastic (PVC cable insulation) is shown below. The OK, NG, gray-zone evaluation with respect to the control values is easily obtained.
* The control values in the results below are set to the maximum permitted concentrations under the RoHS Directive.

Reduced running costs, easier maintenance

Receiving inspections and other screening for pass/fail evaluation of the harmful element content against control value standards in numerous products require higher operation efficiency and lower running costs in the workplace.? EDX-LE meets all these requirements.

Detector requires no liquid nitrogen

As the detector requires no cooling by liquid nitrogen, running costs are significantly reduced.

X-ray tube automatic aging
Aging to extend the service life of the X-ray tube is an essential instrument management process. X-ray tube aging is performed automatically when the instrument is restarted after a long period. This improves operation and prevents breakdowns.

Pre-measurement instrument checks

Instrument calibration is required to obtain stable analysis results. However, the calibration operations and evaluation should be as quick as possible. EDX-LE supports an energy check and quantitation value check on start-up. Calibration is performed automatically, if required.

Easily customize screening to suit your control system

As it may be necessary to change control values on a daily basis according to the product, the screening conditions can be easily changed to suit the control system. Efficient operations from the start of analysis to report creation are possible.
Software access restrictions prevent inadvertent changes to screening conditions by people without the authority to change the conditions.

Easy screening setup

A threshold value can be set for each material and element. The screening evaluation method can be changed according to how the threshold value is entered. The lower limit of the threshold value can be observed for each material as an aid to setting the threshold value.

The method of displaying the evaluation results in the report (OK, gray-zone, NG) can be customized.

The report style can also be set. A template supplied as standard with the instrument can be selected.

Condition protection

A password can be set to restrict changes to the screening conditions and preferences, enhancing the security of software operation.

Easily carry out difficult tasks

• The [Screening Analysis] window makes operation easy
• Fully automatic, from determining main components to selecting conditions

The [Screening Analysis] window makes operation easy

Simple procedures ensure worry-free operation, even for first-time users

Start sample measurement from [Screening Analysis], using simple steps. Measurement condition selection, which typically relies on the judgment of the experimenter, is determined automatically.

1st Step

Place the Sample
 

• After placement, the sample observation camera observes the sample and confirms the sample’s analysis position.
• Set the analysis area to 3 mm, 5 mm, or 10 mm diameter.
• Close the sample chamber.

2nd Step

Select Analysis Conditions/ Enter Sample Name
 

• The [Measurement Preparation] window displays the current sample image. Use this window to select analysis conditions and enter a sample name.
• Start measurement with a single click.

3rd Step

Display of Analysis Result
 

• After measurements are completed, [Pass/Fail Judgment], [Concentration], and [3σ(Measurement Variance)] are displayed for all 5 elements in an easy-to-understand layout.
• Display the [Result List] and [Individual Report] with a single mouse click.

Fully automatic, from determining main components to selecting conditions

A single click in the [Screening Analysis] window automatically performs everything from measurement to the display of results, in accordance with your pre-registered analysis conditions.

Automatic Calibration Curve Selection Function

Automatic Calibration Curve Selection Function

All necessary functions are provided

• All in one: equipped with all required RoHS/ELV analysis functions
• Large Sample Chamber enables as-is measurement of large samples
• RoHS, Halogen, Antimony Compatible EDX-LE Check Sample
• Additional Function Kit

All in one: equipped with all required RoHS/ELV analysis functions

EDX-LE standard equipment includes all the functions required for RoHS/ELV analysis, providing users with the optimal RoHS/ELV analysis system, without needing special options.

Sample Observation Function

When measuring foreign substances and samples with multiple parts, the sample observation camera allows analysis position to be easily specified by checking the camera image. If the sample is small or if specific locations on the sample are being measured, the collimator can be used to change the Xray exposure region to 1 mm, 3 mm, 5 mm, or 10 mm diameter.

Shape Correction Function

X-ray intensity differs with the shape and thickness of samples, even if they contain the same material, and will have an impact on quantitative values. EDX-LE utilizes a BG internal standard method to eliminate the effect of shape and thickness in order to provide highly precise results. *BG internal standards method: Fluorescent X-ray intensity of each element is standardized using scattered X-ray intensity.

Organize measurement results in a list

List Creation Function

List stored data in Excel format.

Large Sample Chamber enables as-is measurement of large samples

Contrary to its compact-sized body, the EDX can accommodate larger samples than one would imagine, up to W 370 mm x D 321 mm x H 155 mm.

RoHS, Halogen, Antimony Compatible EDX-LE Check Sample

Enables Antimony Screening in Addition to RoHS/ELV and Halogen Screening

• No hardware modification or software installation required*
• Simply exchange check sample
• Allows measurement of all 7 elements including those specified by the RoHS directive, Halogen regulation and Antimony (Cd, Pb, Hg, Cr, Br, Cl, and Sb) using the same analytical conditions

Specifications

Antimony Screening Can Be Conducted Simultaneously

The same analytical conditions can be used to measure all 7 elements specified by the RoHS directive, halogen regulation and Antimony (Sb, Cd, Pb, Hg, Cr, Br, and Cl).

Quantitative Analysis of Antimony (Sb) in Plastics by EDXRF

Additional Function Kit for the EDX-LE

Add general analysis functions to the EDX-LE RoHS/ELV screening model.

Features available after installing the kit:

1. Elements not subject to RoHS/ELV regulations can be identified and quantitated.
2. Detailed measurement and analysis conditions can be created according to the application.
3. Film FP method allows analysis of multilayer film thickness, composition, and deposit volume.
4. Matching functions offer metal type identification and product identification.

Example of Measurements Using the Additional Function Kit

Qualitative/Quantitative Analysis

Thin Film Analysis

Matching (steel type identification, product identification)