Shimadzu’s iSpect DIA-10 Dynamic Image Analyzer combines particle size and image analysis technology to offer complete particle characterization. It can perform particle imaging, size analysis, and foreign object detection, and obtain size distributions and number concentration, in as little as two minutes.

Reliable Particle Detection System

The system utilizes a microcell and advanced optics to accurately and efficiently detect particles. Using normal lenses, the apparent size of particles can be affected by the depth of the particle relative to the lens. The iSpect DIA-10 uses a telecentric lens that maintains a constant image magnification. This means that no matter where the particle is located in the field of vision, the system will accurately determine the size of the particle. The autofocus function increases the imaging efficiency^*1 which makes it possible to accurately detect foreign objects and obtain repeatable number concentration.

*1: The ratio of the number of sample particle images acquired to the number of particles in the sample that has flowed through the system.

Efficient Image Acquisition

The microcell increases image acquisition efficiency by passing particles through a narrow imaging area, which optimizes the number of particles observed. Compared with a conventional cell and lens, the microcell clearly shows particle images and fewer particles pass outside of the lateral imaging area. This makes it possible to reliably detect particles and obtain highly repeatable number concentration (Coefficient of Variation (CV) ±5 %^*2).

*2: When measured using a Shimadzu standard sample. Depends on the sample.

Example of Number Concentration Measurement

Results of 6 Measurements (The ● mark is the mean, and the error bar is the standard deviation)

Unprecedented Functionality and Performance

Trace Sample Measurement

The system can measure sample as small as 50 μL, enabling it to handle trace samples. Samples can be set directly onto the system using a general disposable pipette tip to transfer a sample from a container. This allows simple operation while preventing contamination.

Flow Path Design Provides Small Dead Volume

Microcells with small internal volumes and small dead volume (less than 50 μL) enable cleaning solution to be reduced.

Reduced Use of Organic Solvents 

The flow path has excellent resistance to organic solvents. Because of the small amount of organic solvent needed for measurement and cleaning, the system reduces waste and minimizes environmental impact.

Autofocus Function for Easy Operation

The autofocus function eliminates the need for troublesome focusing and no flow of sample particles is required. By automating the focusing, data variation between operators is prevented, making measurement both easy and stable.

Compact, Easy to Install Design

The compact design (the measurement unit is about 22 cm wide and the pump unit is about 10 cm wide) allows installation in a small space.

Easy Operation

Measurement results are obtained in three steps. Pump operation and particle imaging are performed automatically according to the analytical conditions selected. In addition, particle images can be simultaneously monitored and measured in real time while the sample flows through the unit.

* Measurement Parameters (13 Types)

Area circle equivalent diameter, perimeter equivalent diameter, maximum length, maximum perpendicular length, vertical Feret diameter, horizontal Feret diameter,
particle perimeter, envelope perimeter, circularity, aspect ratio, horizontal bounding rectangle aspect ratio, particle area, average brightness

WingSALD software for Windows® 95 provides flexibility for setting up test samples and enables real time display of particle size distribution. Enhanced data processing capability includes superimposed comparison of up to 12 graphs to establish trends and confirm reproducibility.

Specifications SALD-201V

* Depends on the characteristics of the sample particles

IG-1000 Plus Features

High-Sensitivity Analysis of Single Nanoparticles

Optical signals emitted by the diffraction grating formed by the particles, not scattered light emitted by the particles, is used for measurement and so, even in the single nano region, a sufficient S/N ratio can be obtained, and stable measurement with good reproducibility is possible.

Resistance to Contamination

The new measurement principle is resistant to contamination and so, even if the sample is mixed with small amounts of foreign particles, information about the particles to be analyzed is still caputured. Therefore the filtering of samples in order to remove coarse particles is not required.

High Reproducibility

The new measurement method ensures high reproducibility and the acquisition of stable data. In particular, high reproducibility for particle sizes of less than 10 nm removes the uncertainty and vagueness of particle analysis in the single nano region. Also, comparison with raw data of diffracted light is possible and so rough validation of the measurement results can be performed simply.

What Is the “Induced Grating Method”?

The concentration of nanoparticles expresses itself as the amount of change in the refractive index of the medium and so if a cyclic concentration distribution of the particles is formed in the medium by an external force, it functions as a diffraction grating. If the external force is removed, the diffraction grating disappears. With the IG method, the decay process of this particle density diffraction grating is measured via the change in intensity of the diffracted light, and a diffusion coefficient is obtained.

Diffraction Grating Consisting of Microscopic Particles Formed by Dielectrophoresis

An alternating voltage is applied to cyclically arranged electrodes, and a cyclic concentration distribution of microscopic particles is formed in the liquid by dielectrophoresis. Although the cyclic concentration distribution of microscopic particles acts as a diffraction grating (a particle concentration diffraction grating), if the alternating voltage is stopped, the grating diffuses and disappears (patent pending).

Key Point of IG Method

-Precision Measurement Achieved with Modification of Electrode Configuration-

The cyclically arranged electrodes also function as a diffraction grating. The diffracted light created by this electrode diffraction grating is weaker than the diffracted light created by the particle concentration diffraction grating, and in order to precisely measure the changes in the primary diffracted light resulting from the diffusion of the particle concentration diffraction grating, it is ensured that the positions of the two forms of primary diffracted light do not coincide. For this reason, the electrode configuration has been modified as shown in the figure so that the pitch of the electrode diffraction grating is half that of the particle concentration diffraction grating (patent pending).

Wide applicability

Using the SALD-MS23 sampler, the measurement range is 17nm to 2500μm for wet measurement.
For example, PSL particles with a median diameter of 50nm and stainless balls with a diameter of 2mm can be measured by a single analyzer.

The system configuration can be optimized to address various uses, purposes, measurement objects,
environments and conditions.

Various sample amounts (Suspension) can be selected according to measurement objects and purposes.

• Sample amount for SALD-MS23 is variable: 100mL, 200mL, or 300mL.
• Sample amount for batch cell SALD-BC23 is 12mL.
• In the case of high-concentration sample measurement system SALD-HC23, optional indentation can be used for sample amounts ranging from 15μL to 150μL.

High sensitivity / High concentration

By enabling measurement under wide particle concentration conditions (0.1ppm to 20%), changes in particle size distribution depending on particle concentration can be evaluated.
Previously, the particle concentration of a sample had to be adjusted to meet the optimum conditions of analyzers by dilution or concentration using a centrifuge. In these cases, changes in particle size distribution, such as agglomerations or dispersions, could not be considered.

Dispersions and agglomeration can be caused by dilutions.
In some cases, dilutions can accelerate dispersions, but in other cases, they can create agglomerates. To ensure optimum, the initial particle concentration must be determined without dilutions or concentrations. After the evaluation of particle size distribution at the initial state, the effects of particle concentration from dispersions and agglomerations must be evaluated.

Wide particle concentration range must be covered to evaluate the dissolution process of sample particles.
This is necessary because the progress of dissolution makes the particle concentration low in comparison to the first particle concentration.

SALD-2300 can measure particle size distribution under the conditions of particle concentration from 0.1ppm to 20%.
When the sampler SALD-MS23 or batch cell SALD-BC23 is used, measurements are possible under conditions of concentration from 0.1ppm to 100ppm.
When the high-concentration sample measurement system SALD-HC23 is used, high-concentration samples up to 20% can be measured because the negative effects of multiple scattering are prevented.

Measurement without dilution of hand cream

In the case of hand cream, dilutions make the particle size distribution narrow. Measurements without dilutions must be done to obtain accurate measurement.

Evaluation of a fine particle included in red wine

The graph to the left shows the result of measuring red wine in the state of the undiluted solution.
The low-concentration sample can be measured as an undiluted solution.
Measuring it in this state can remove the influence of dispersion or agglomeration by the concentration operation.

Evaluation of negative electrode material of a secondary battery

At left is a graph showing the results of measuring a carbon black particle.
The agglomeration particle (micrometer range) has been dispersed to the fine particle (sub-micrometer range) by dispersion processing using a homogenizer. The sample (sample that absorbs light like the carbon black) that doesn’t transmit light easily can be measured based on the improvement in sensitivity.

* Appearance and specifications are subject to change without notice.

Providing Secure, Confident Data Management on a Network System

The SALD-2300 laser diffraction particle size analyzer is now compatible with data integrity requirements. Connecting LabSolutions SALD to the LabSolutions system, with its proven compatibility with ER/ES regulations, enables confident, reliable data management. In addition to SALD data, consolidated management is available for LC, GC, and UV data.

Wide Measurement Range : 7 nm to 800 μm From primary particles to sub-visible particles and contaminants

• Changes in particle size across the 7 nm to 800 μm measurement range can be continuously measured using a single light source, single optical system and single measurement principle.
• Since a primary particle and an aggregate and contaminant can be measured with one system, the aggregation properties by a dispersion condition can be checked.

The evaluation of the dispersion and aggregation characteristics of the particles is realized with a wide measurement range and in real time.

Single detection face continuously captures forward- scattered light up to a 60° angle

The target particle size range is seamlessly covered using a single measurement principle, single optical system, and single light source. Additionally, because the SALD-7500nano does not incorporate multiple optical systems that create discontinuities in the data, accurate particle size distribution measurements are possible across the entire measurement range using a single standard. The application of the SLIT* optical system, based on sophisticated scattered light intensity tracing technology, smashes conventional wisdom to continuously capture forward-scattered light at up to a wide 60° angle on a single detector face. This achieves high resolution in the fine particle region.
* SLIT (Scattered Light Intensity Trace)

High-Resolution / High-Sensitivity Wing Sensor ll

High-Resolution/High-Sensitivity Wing Sensor ll Forward diffracted/scattered light is detected by a “wing sensor ll”, a 76-element sensor developed using semiconductor manufacturing technology of the highest level. This sensor can detect greatly fluctuating small-angle forward scattering light with a high level of resolution and wide-angle scattering light of a low optical intensity with a high level of sensitivity. Also, side scattered light is detected by one sensor element and back scattered light is detected by four sensor elements. Accurately capturing light intensity distribution patterns with a total of 81 sensor elements enables the high-resolution, high-precision measurement of particle size distributions over a wide particle diameter range.

More Stable Optical System

The Omnidirectional Shock Absorption Frame (OSAF) fully isolates all elements of the optical system from shocks and vibrations. This eliminates concerns about adjusting the optical axis.

Built-in Self-Diagnostic Functions Ensure Easy Maintenance

These analyzers incorporate powerful self-diagnostic functions. The output signals sent by the sensors and detecting elements and the instrument operating status can be checked, facilitating easier maintenance. Using the Operation Log function, detailed information about, for example, the instrument usage status and contamination of the cells is included with all the measurement data, making it is possible to investigate the validity of measurement data obtained in the past.

Laser diffraction method ISO 13320 and JIS Z 8825-1 compliant

Tke SALD-7500nano complies with ISO 13320 and JIS Z 8825-1 laser diffraction and scattering standards.

Validation possible with JIS standard particles

System performances can be confirmed using a MBP1-10 standard particle specified in JIS Z8900-1. These samples have a broad particle size distribution, which is specified by the JIS standard. Using these samples allows verifying that the instrument is always accurate.

Allows verifying the validity of measurement results by referencing light intensity distribution data

Since light intensity distribution data (raw data) and measurement results (particle size distribution data) can be displayed on the same screen, measurement results can be verified while viewing both data sets. This allows users to verify whether the detection signal level (particle concentration) is appropriate, and to confirm the validity of measurement results from multiple aspects, such as in terms of the distribution width and the presence of aggregates and contaminants.

Wide application applicability

The system configuration can be optimized to address various uses, purposes, measurement objects, environments and conditions.

Eliminates the mistake or trouble of selecting refractive indices

Automatic Refractive Index Calculation Function
Selecting a refractive index was an unavoidable part of using the laser diffraction method, where generally a published value was entered, but such values were not necessarily appropriate, considering the effects of particle composition and shape. Therefore, tedious trial and error processes were used to select refractive indices.
WingSALD II solves such problems by being the world’s first software to include a function that automatically calculates an appropriate refractive index based on the LDR (light intensity distribution reproduction) method.