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The Shimadzu DLC-MR2 Multi-Deposition System is shown above. The SMX-225CT microfocus X-ray CT non-destructive testing system
 

Non-destructive testing and inspection systems are a vita[ component of every imaginable manufacturing process to ensure ultimate material and product quality. Shimadzu systems are available to cover a wide range of these applications from the heaviest machinery to the microscopic field of electronic components.

Efforts to continually reduce the physical size of microchips for computers and the endless variety of other electronic paraphernalia, while increasing the electronic density of these components, wilt never cease. This wilt continue to provide the motivation for new and innovative solutions to test these devices.


Shimadzu’s microfocus X-ray CT systems were developed to meet these challenges and requirements for increased compactness and are without peer. With the growing importance of semiconductor component production, Shimadzu continues to place emphasis on the development and application of technology and products in this field. To this end, the manufacture of more traditional products is being transferred to affiliated companies, enabling greater focus of research and manufacturing resources on products for the more sophisticated requirements of the electronics industry.
 


Windows-based software with exceptional graphics capability ensures the optimum performance and usability of SMX-225 microfocus system


Industry is constantly striving to improve the area density of computer HDD systems. Shimadzu thin film deposition technology currently leads the world in this field. Giant magnetoresistive (GMR) films which are able to detect much smaller magnetic fields are now being developed and will provide a giant leap forward by allowing unparalleled storage capacities on a new range of drives and devices for computer memories.

 


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